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Proceedings Paper

Real-time IR/EO scene generation utilizing an optimized scene rendering subsystem
Author(s): Robert J. Makar; Daniel B. Howe
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Paper Abstract

This paper describes advances in the development IR/EO scene generation using the second generation Comptek Amherst Systems' Scene Rendering Subsystem (SRS). The SRS is a graphics rendering engine designed specifically to support real-time hardware-in-the-loop testing of IR/EO sensor systems. The SRS serves as an alternative to commercial rendering systems, such as the Silicon GraphicsR InfiniteReality, when IR/EO sensor fidelity requirements surpass the limits designed into COTS hardware that is optimized for visual rendering. The paper will discuss the need for such a system and will present examples of the kinds of sensor tests that can take advantage of the high radiometric fidelity provided by the SRS. Examples of situations where the high spatial fidelity of the InfiniteReality is more appropriate will also be presented. The paper will also review models and algorithms used in IR/EO scene rendering and show how the design of the SRS was driven by the requirements of these models and algorithms. This work has been done in support of the Infrared Sensor Stimulator system (IRSS) which will be used for installed system testing of avionics electronic combat systems. The IRSS will provide a high frame rate, real-time, reactive, hardware-in-the-loop test capability for the stimulation of current and future infrared and ultraviolet based sensor systems. The IRSS program is a joint development effort under the leadership of the Naval Air Warfare Center -- Aircraft Division, Air Combat Environment Test and Evaluation Facility (ACETEF) with close coordination and technical support from the Electronic Combat Integrated Test (ECIT) Program Office. The system will be used for testing of multiple sensor avionics systems to support the Development Test & Evaluation and Operational Test & Evaluation objectives of the U.S. Navy and Air Force.

Paper Details

Date Published: 12 July 2000
PDF: 10 pages
Proc. SPIE 4027, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V, (12 July 2000); doi: 10.1117/12.391682
Show Author Affiliations
Robert J. Makar, Comptek Amherst Systems, Inc. (United States)
Daniel B. Howe, Comptek Amherst Systems, Inc. (United States)


Published in SPIE Proceedings Vol. 4027:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V
Robert Lee Murrer, Editor(s)

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