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Proceedings Paper

Advancements in real-time IR/EO scene generation utilizing the Silicon Graphics Onyx2
Author(s): Onda D. Simmons; Stephen E. Jacobs; Robert J. Makar; Frank J. Stanley; Thomas W. Joyner; Keem B. Theim
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Paper Abstract

This paper describes advances in the development of IR/EO scene generation to support the Infrared Sensor Stimulator system (IRSS) which will be used for installed system testing of avionics electronic combat systems. The IRSS will provide a high frame rate, real-time, reactive, hardware-in-the-loop test capability for the stimulation of current and future infrared and ultraviolet based sensor systems. Scene generation in the IRSS is provided by an enhanced version of the Real-time (IR/EO Scene Simulator (RISS) which was previously developed by Comptek Amherst Systems. RISS utilizes the symmetric multiprocessing environment of the Silicon GraphicsR Onyx2TM to support the generation of IR/EO scenes in real-time. It is a generic scene generation system which can be programmed to accurately stimulate a wide variety of sensors. Significant advancements have been made in IRSS capabilities in the past year. This paper will discuss the addition of new simulation techniques which have been added to the system to better support the high resolution, geospecific testing requirements of a new generation of imaging sensors. IRSS now better supports the use of high resolution databases which contain material maps at photo realistic precision. Other developments which will be discussed include extensive improvements to the database and scenario development tools, advancements in the support for multiple synchronized scene generation channels, and new support for sea and ship models.

Paper Details

Date Published: 12 July 2000
PDF: 11 pages
Proc. SPIE 4027, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V, (12 July 2000); doi: 10.1117/12.391681
Show Author Affiliations
Onda D. Simmons, Comptek Amherst Systems, Inc. (United States)
Stephen E. Jacobs, Comptek Amherst Systems, Inc. (United States)
Robert J. Makar, Comptek Amherst Systems, Inc. (United States)
Frank J. Stanley, Comptek Amherst Systems, Inc. (United States)
Thomas W. Joyner, Naval Air Warfare Ctr. (United States)
Keem B. Theim, Air Force Flight Test Ctr. (United States)


Published in SPIE Proceedings Vol. 4027:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V
Robert Lee Murrer, Editor(s)

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