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Proceedings Paper

Radiation damage in the Chandra x-ray CCDs
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Paper Abstract

Front side illuminated CCDs comprising focal plane of Chandra X-ray telescope have suffered some radiation damage in the beginning of the mission. Measurements of CTI and dark current at different temperatures led us to conclusion that the type of damage is inconsistent with the much studied type of damage created by protons with energies higher than 10 MeV. Intensive ground based investigation showed that irradiation of CCD with low energy protons (about 100 keV) results in the device characteristics very similar to the ones of the flight chips (very low dark current, the shape of the CTI temperature dependence). We were able to reliably determine that only image section of the flight chips was damaged and therefore only fast transfer from image to frame store section was affected. We have developed several techniques in order to determine the parameters of the electron traps introduced into the transfer channel of the irradiated device.

Paper Details

Date Published: 18 July 2000
PDF: 11 pages
Proc. SPIE 4012, X-Ray Optics, Instruments, and Missions III, (18 July 2000); doi: 10.1117/12.391612
Show Author Affiliations
Gregory Y. Prigozhin, Massachusetts Institute of Technology (United States)
Steven E. Kissel, Massachusetts Institute of Technology (United States)
Mark W. Bautz, Massachusetts Institute of Technology (United States)
Catherine Grant, Massachusetts Institute of Technology (United States)
Beverly LaMarr, Massachusetts Institute of Technology (United States)
Richard F. Foster, Massachusetts Institute of Technology (United States)
George R. Ricker, Massachusetts Institute of Technology (United States)
Gordon P. Garmire, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 4012:
X-Ray Optics, Instruments, and Missions III
Joachim E. Truemper; Bernd Aschenbach, Editor(s)

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