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Proceedings Paper

Hard x-ray characterization of a HEFT single-reflection prototype
Author(s): Finn Erland Christensen; William W. Craig; Charles J. Hailey; Mario A. Jimenez-Garate; David L. Windt; Fiona A. Harrison; Peter H. Mao; Eric Ziegler; Veijo Honkimaki; Manuel Sanchez del Rio; Andreas K. Freund; M. Ohler
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Paper Abstract

We have measured the hard X-ray reflectivity and imaging performance from depth graded W/Si multilayer coated mirror segments mounted in a single reflection cylindrical prototype for the hard X-ray telescopes to be flown on the High Energy Focusing Telescope (HEFT) balloon mission. Data have been obtained in the energy range from 18 - 170 keV at the European Synchrotron Radiation Facility and at the Danish Space Research Institute at 8 keV. The modeling of the reflectivity data demonstrate that the multilayer structure can be well described by the intended power law distribution of the bilayer thicknesses optimized for the telescope performance and we find that all the data is consistent with an interfacial width of 4.5 angstroms. We have also demonstrated that the required 5% uniformity of the coatings is obtained over the mirror surface and we have shown that it is feasible to use similar W/Si coatings for much higher energies than the nominal energy range of HEFT leading the way for designing Gamma-ray telescopes for future astronomical applications. Finally we have demonstrate 35 arcsecond Half Power Diameter imaging performance of the one bounce prototype throughout the energy range of the HEFT telescopes.

Paper Details

Date Published: 18 July 2000
PDF: 13 pages
Proc. SPIE 4012, X-Ray Optics, Instruments, and Missions III, (18 July 2000); doi: 10.1117/12.391602
Show Author Affiliations
Finn Erland Christensen, Danish Space Research Institute (Denmark)
William W. Craig, Columbia Univ. (United States)
Charles J. Hailey, Columbia Univ. (United States)
Mario A. Jimenez-Garate, Columbia Univ. (United States)
David L. Windt, Columbia Univ. (United States)
Fiona A. Harrison, California Institute of Technology (United States)
Peter H. Mao, California Institute of Technology (United States)
Eric Ziegler, European Synchrotron Radiation Facility (France)
Veijo Honkimaki, European Synchrotron Radiation Facility (France)
Manuel Sanchez del Rio, European Synchrotron Radiation Facility (France)
Andreas K. Freund, European Synchrotron Radiation Facility (France)
M. Ohler, Institute of Microtechnology (Germany)


Published in SPIE Proceedings Vol. 4012:
X-Ray Optics, Instruments, and Missions III
Joachim E. Truemper; Bernd Aschenbach, Editor(s)

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