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Proceedings Paper

Multichannel silicon drift detectors for x-ray spectroscopy
Author(s): Peter Lechner; Werner Buttler; Carlo Fiorini; Robert Hartmann; Josef Kemmer; Norbert Krause; Paolo Leutenegger; Antonio Longoni; Heike Soltau; Diana Stoetter; R. Stoetter; Lothar Strueder; Ulrich Weber
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Paper Abstract

Silicon Drift Detectors (SDDs) with integrated readout transistor combine a large sensitive area with a small value of the output capacitance and are therefore well suited for high resolution, high count rate X-ray spectroscopy. The low leakage current level obtained by the elaborated process technology makes it possible to operate them at room temperature or with moderate cooling. The monolithic combination of a number of SDDs to a Multichannel Drift Detector solves the limitation in size of the single device and allows the realization of new physics experiments and systems. The description of the device principle is followed by the introduction of the Multichannel Drift Detector concept. Layout, performance, and examples of current and future applications are given.

Paper Details

Date Published: 18 July 2000
PDF: 8 pages
Proc. SPIE 4012, X-Ray Optics, Instruments, and Missions III, (18 July 2000); doi: 10.1117/12.391596
Show Author Affiliations
Peter Lechner, KETEK GmbH (Germany)
Werner Buttler, Ingenieurbuero Buttler (Germany)
Carlo Fiorini, Politecnico di Milano (Italy)
Robert Hartmann, Max-Planck-Institut fuer extraterrestrische Physik (Germany)
Josef Kemmer, KETEK GmbH (Germany)
Norbert Krause, Max-Planck-Institut fuer extraterrestrische Physik (Australia)
Paolo Leutenegger, KETEK GmbH (Germany)
Antonio Longoni, Politecnico di Milano (Italy)
Heike Soltau, KETEK GmbH (Germany)
Diana Stoetter, Max-Planck-Institut fuer extraterrestrische Physik (Germany)
R. Stoetter, KETEK GmbH (Germany)
Lothar Strueder, Max-Planck-Institut fuer extraterrestrische Physik (Germany)
Ulrich Weber, KETEK GmbH (Germany)


Published in SPIE Proceedings Vol. 4012:
X-Ray Optics, Instruments, and Missions III
Joachim E. Truemper; Bernd Aschenbach, Editor(s)

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