Share Email Print
cover

Proceedings Paper

Absolute calibration of ACIS x-ray CCDs using calculable undispersed synchrotron radiation
Author(s): Mark W. Bautz; Michael J. Pivovaroff; Steven E. Kissel; Gregory Y. Prigozhin; Takashi Isobe; Stephen E. Jones; George R. Ricker; R. Thornagel; S. Kraft; Frank Scholze; Gerhard Ulm
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We have performed a series of measurements with the Physikalisch-Technische Bundesanstalt beamline of the electron storage ring BESSY 1 which provide the basis for the absolute calibration of the Advanced CCD Imaging Spectrometer (ACIS). ACIS is a prime focal plane instrument aboard the recently-launched Chandra X-ray Observatory. We have achieved an absolute detection efficiency knowledge accurate to better than 5% over the 0.3 - 4 keV band. We describe our measurement and analysis techniques, including our detector response modeling and pileup corrections. We summarize a variety of external and internal consistency checks which provide the basis for our error estimates. We discuss the factors limiting the accuracy of our measurements.

Paper Details

Date Published: 18 July 2000
PDF: 15 pages
Proc. SPIE 4012, X-Ray Optics, Instruments, and Missions III, (18 July 2000); doi: 10.1117/12.391582
Show Author Affiliations
Mark W. Bautz, Massachusetts Institute of Technology (United States)
Michael J. Pivovaroff, Massachusetts Institute of Technology (United States)
Steven E. Kissel, Massachusetts Institute of Technology (United States)
Gregory Y. Prigozhin, Massachusetts Institute of Technology (United States)
Takashi Isobe, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Stephen E. Jones, Massachusetts Institute of Technology (United States)
George R. Ricker, Massachusetts Institute of Technology (United States)
R. Thornagel, Physikalisch-Technische Bundesanstalt (Germany)
S. Kraft, Physikalisch-Technische Bundesanstalt (Germany)
Frank Scholze, Physikalisch-Technische Bundesanstalt (Germany)
Gerhard Ulm, Physikalisch-Technische Bundesanstalt (Germany)


Published in SPIE Proceedings Vol. 4012:
X-Ray Optics, Instruments, and Missions III
Joachim E. Truemper; Bernd Aschenbach, Editor(s)

© SPIE. Terms of Use
Back to Top