Share Email Print
cover

Proceedings Paper

Polarized monochromatic x-ray beam extracted from laboratory electron impact source
Author(s): Tetsuji Koike; Kiyoshi Hayashida; Yasuaki Hashimoto; Daisuke Akutsu; Masayuki Ohtani; Hiroshi Tsunemi
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We measure the polarization degree of monochromatic X-rays from an electron impact type X-ray generator through a double crystal spectrometer. The double crystal spectrometer is installed so that it enhances the polarization from the generator by its different efficiency for (pi) and (sigma) polarized X-rays. Measurement is performed for applied high voltage (HV) of 20 kV to 50 kV, and monochromatic X-ray energy in the unit of keV (Ex) of 0.7 to 0.9 times HV. We obtain the polarization degree of 0.48 and 0.41 for HV equals 20 and HV equals 50 with Ex/HV equals 0.9. We also measure the polarization degree of direct beam without the monochrometer, comparing the polarization boosting factor by crystals measured with theoretical model. The system is good for getting moderate intensity of partially polarized monochromatic X-ray beam.

Paper Details

Date Published: 18 July 2000
PDF: 8 pages
Proc. SPIE 4012, X-Ray Optics, Instruments, and Missions III, (18 July 2000); doi: 10.1117/12.391578
Show Author Affiliations
Tetsuji Koike, Osaka Univ. (Japan)
Kiyoshi Hayashida, Osaka Univ. and Japan Science and Technology Corp. (Japan)
Yasuaki Hashimoto, Osaka Univ. (Japan)
Daisuke Akutsu, Osaka Univ. (Japan)
Masayuki Ohtani, Japan Science and Technology Corp. (Japan)
Hiroshi Tsunemi, Osaka Univ. and Japan Science and Technology Corp. (Japan)


Published in SPIE Proceedings Vol. 4012:
X-Ray Optics, Instruments, and Missions III
Joachim E. Truemper; Bernd Aschenbach, Editor(s)

© SPIE. Terms of Use
Back to Top