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Proceedings Paper

Orbital verification of the CXO high-resolution mirror assembly alignment and vignetting
Author(s): Terrance J. Gaetz; Diab Jerius; Richard J. Edgar; Leon P. Van Speybroeck; Daniel A. Schwartz; Maxim L. Markevitch; S. C. Taylor; Norbert S. Schulz
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Paper Abstract

Prior to launch, the High Resolution Mirror Assembly (HRMA) of the Chandra X-ray Observatory underwent extensive ground testing at the X-ray Calibration Facility (XRCF) at the Marshall Space Flight Center in Huntsville, Alabama. The resulting data were used to validate a high fidelity raytrace model for the HRMA performance. Further observations made during the post-launch Orbital Activation and Calibration period allow the on-orbit condition of the X-ray optics to be assessed. Based on these ground-based and on-orbit data, we examine the alignment of the X-ray optics based on the off-axis point spread function. We discuss how single-reflection ghost data obtained at XRCF can be used to better constrain the HRMA optical axis data. We examine the vignetting and the single-reflection ghost suppression properties of the telescope. Slight imperfections in alignment lead to a small azimuthal dependence of the off- axis effective area; the morphology of off-axis images also shows an additional small azimuthal dependence varying as 1/2 the position angle.

Paper Details

Date Published: 18 July 2000
PDF: 12 pages
Proc. SPIE 4012, X-Ray Optics, Instruments, and Missions III, (18 July 2000); doi: 10.1117/12.391574
Show Author Affiliations
Terrance J. Gaetz, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Diab Jerius, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Richard J. Edgar, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Leon P. Van Speybroeck, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Daniel A. Schwartz, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Maxim L. Markevitch, Harvard-Smithsonian Ctr. for Astrophysics (United States)
S. C. Taylor, Massachusetts Institute of Technology (United States)
Norbert S. Schulz, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 4012:
X-Ray Optics, Instruments, and Missions III
Joachim E. Truemper; Bernd Aschenbach, Editor(s)

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