Share Email Print

Proceedings Paper

Development of compound semiconductors for planetary and astrophysics space missions
Author(s): Alan Owens; Marcos Bavdaz; Hans Andersson; Giuseppe Bertuccio; Thomas Gagliardi; V. Gostillo; I. Lisjutin; Seppo Arvo Anter Nenonen; Anthony J. Peacock; Heikki Sipila; L. Troeger; Sergey Zatoloka
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We discuss the observational requirements for future x-ray planetary and astrophysics missions and present preliminary laboratory results from our compound semiconductor program. The detectors used in the tests were simple monolithic devices, which are used in conjunction with a detailed material science and technology developmental program intended to produce near Fano limited, pixilated hard X-ray detectors. In practical terms, this means producing active arrays, comprised of over 103 pixels each being of order 100 microns in size, with spectral resolving powers, E/(Delta) E > 20 at 10 keV and high quantum efficiencies over the energy range 1 to 200 keV. Four materials are currently under study--GaAs, HgI2, TlBr and CdZnTe. In the cases of GaAs and CdZnTe, the detector energy resolution functions are approaching the Fano limit.

Paper Details

Date Published: 18 July 2000
PDF: 12 pages
Proc. SPIE 4012, X-Ray Optics, Instruments, and Missions III, (18 July 2000); doi: 10.1117/12.391558
Show Author Affiliations
Alan Owens, European Space Agency/ESTEC (Netherlands)
Marcos Bavdaz, European Space Agency/ESTEC (Netherlands)
Hans Andersson, Metorex International Oy (Finland)
Giuseppe Bertuccio, Politecnico di Milano (Italy)
Thomas Gagliardi, Metorex, Inc. (United States)
V. Gostillo, Baltic Scientific Instruments (Latvia)
I. Lisjutin, Baltic Scientific Instruments (Latvia)
Seppo Arvo Anter Nenonen, Metorex International Oy (Finland)
Anthony J. Peacock, European Space Agency/ESTEC (Netherlands)
Heikki Sipila, Metorex International Oy (Finland)
L. Troeger, HASYLAB at DESY (Netherlands)
Sergey Zatoloka, Baltic Scientific Instruments (Latvia)

Published in SPIE Proceedings Vol. 4012:
X-Ray Optics, Instruments, and Missions III
Joachim E. Truemper; Bernd Aschenbach, Editor(s)

© SPIE. Terms of Use
Back to Top