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Proceedings Paper

Fully depleted backside-illuminated spectroscopic active pixel sensors from the infrared to x rays (1 eV to 25 keV)
Author(s): Lothar Strueder; Norbert Meidinger; Elmar Pfeffermann; Robert Hartmann; Heinrich W. Braeuninger; Norbert Krause; Gisela D. Hartner; Konrad Dennerl; Frank Haberl; S. Kemmer; Martin Popp; Joachim E. Truemper; Johannes Kollmer; T. Johannes; Gerhard Lutz; D. Hauff; Rainer H. Richter; Peter Klein; N. Hoernel; P. Solc; Rouven Eckhardt; Peter Fischer; W. Neeser; J. Ulrici; Norbert Wermes; Peter Holl; Peter Lechner; Josef Kemmer; Heike Soltau; R. Stoetter; Ulrich Weber; U. Weichert
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Paper Abstract

Large format arrays covering a wide bandwidth from 1 eV to 25 keV will be used in the focal plane of X-ray telescopes as well as in adaptive optics systems. As the readout speed requirements increase drastically with the collecting area, but noise figures have to be on the lowest possible level, CCD-type detectors do not seem to be able to fulfill the experiment expectations. Active pixel sensors (APS) have the capability to randomly select areas of interest and to operate at noise levels below 1 electron (rms). One prominent candidate for the use of an APS is XEUS: The X-ray Evolving Universe Spectroscopy mission. It represents a potential follow-on mission to the ESA cornerstone XMM currently in orbit. The XEUS mission was considered as part of ESA's Horizon 2000+ within the context of the International Space Station.

Paper Details

Date Published: 18 July 2000
PDF: 18 pages
Proc. SPIE 4012, X-Ray Optics, Instruments, and Missions III, (18 July 2000); doi: 10.1117/12.391556
Show Author Affiliations
Lothar Strueder, Max-Planck-Institut fuer extraterrestrische Physik (Germany)
Norbert Meidinger, Max-Planck-Institut fuer extraterrestrische Physik (Germany)
Elmar Pfeffermann, Max-Planck-Institut fuer extraterrestrische Physik (Germany)
Robert Hartmann, Max-Planck-Institut fuer extraterrestrische Physik (Germany)
Heinrich W. Braeuninger, Max-Planck-Institut fuer extraterrestrische Physik (Germany)
Norbert Krause, Max-Planck-Institut fuer extraterrestrische Physik (Australia)
Gisela D. Hartner, Max-Planck-Institut fuer extraterrestrische Physik (Germany)
Konrad Dennerl, Max-Planck-Institut fuer extraterrestrische Physik (Germany)
Frank Haberl, Max-Planck-Institut fuer extraterrestrische Physik (Germany)
S. Kemmer, Max-Planck-Institut fuer extraterrestrische Physik (Germany)
Martin Popp, Max-Planck-Institut fuer extraterrestrische Physik (Germany)
Joachim E. Truemper, Max-Planck-Institut fuer extraterrestrische Physik (Germany)
Johannes Kollmer, Max-Planck-Institut fuer extraterrestrische Physik (Germany)
T. Johannes, Max-Planck-Institut fuer extraterrestrische Physik (Germany)
Gerhard Lutz, Max-Planck-Institut fuer Physik (Germany)
D. Hauff, Max-Planck-Institut fuer Physik (Germany)
Rainer H. Richter, Max-Planck-Institut fuer Physik (Germany)
Peter Klein, Max-Planck-Institut fuer Physik (Germany)
N. Hoernel, Max-Planck-Institut fuer Physik (Germany)
P. Solc, Max-Planck-Institut fuer Physik (Germany)
Rouven Eckhardt, Max-Planck-Institut fuer Physik (Germany)
Peter Fischer, Univ. Bonn (Germany)
W. Neeser, Univ. Bonn (Germany)
J. Ulrici, Univ. Bonn (Germany)
Norbert Wermes, Univ. Bonn (Germany)
Peter Holl, KETEK GmbH (Germany)
Peter Lechner, KETEK GmbH (Germany)
Josef Kemmer, KETEK GmbH (Germany)
Heike Soltau, KETEK GmbH (Germany)
R. Stoetter, KETEK GmbH (Germany)
Ulrich Weber, KETEK GmbH (Germany)
U. Weichert, KETEK GmbH (Germany)


Published in SPIE Proceedings Vol. 4012:
X-Ray Optics, Instruments, and Missions III
Joachim E. Truemper; Bernd Aschenbach, Editor(s)

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