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Proceedings Paper

X-ray imaging spectrometers for Astro-E: ground calibration in the soft x-ray range
Author(s): Kiyoshi Hayashida; Shunji Kitamoto; Emi Miyata; Hiroshi Tsunemi; Kumi Yoshita; Takayoshi Kohmura; Kouji Mori; Kazunori Katayama; Haruyoshi Katayama; Makoto Shouho; Motoari Ohta; Tadayasu Dotani; Masanobu Ozaki; Katsuji Koyama; Hisamitsu Awaki; Takeshi G. Tsuru; George R. Ricker; Mark W. Bautz; Richard F. Foster; Steven E. Kissel
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Paper Abstract

Soft X-ray response of X-ray Imaging Spectrometers (XIS) for the Astro-E satellite is measured with a grating spectrometer system at Osaka. First, relation between incident X-ray energy and output pulse height peak (E-PH relation) is examined with an SX grating. It is found that jump in the E-PH relation around Si-K edge is at most 2.7 eV. Second, quantum efficiency (QE) of the XIS in 0.4 - 2.2 keV range is measured relatively to the reference CCD of which absolute QE was calibrated with a gas proportional counter. The QE is fitted with a model in which CCD gate structures are considered. Systematic error on the QE results is estimated by referring an independent measurement. Third, tuning and improvement of the response function is performed. We employ six components to reproduce the response profile of the XIS. In this paper, improvement of one component which is originated in the events absorbed in the channel-stop is presented. Nevertheless, Astro-E was lost due to the launch failure. We overview the XIS project in its flight model phase, modified points of the design, problems and solutions etc., in order to be utilized in a possible recovery of the satellite.

Paper Details

Date Published: 18 July 2000
PDF: 14 pages
Proc. SPIE 4012, X-Ray Optics, Instruments, and Missions III, (18 July 2000); doi: 10.1117/12.391548
Show Author Affiliations
Kiyoshi Hayashida, Osaka Univ. and Japan Science and Technology Corp. (Japan)
Shunji Kitamoto, Osaka Univ. and Japan Science and Technology Corp. (Japan)
Emi Miyata, Osaka Univ. and Japan Science and Technology Corp. (Japan)
Hiroshi Tsunemi, Osaka Univ. and Japan Science and Technology Corp. (Japan)
Kumi Yoshita, Osaka Univ. (Japan)
Takayoshi Kohmura, Osaka Univ. (Japan)
Kouji Mori, Osaka Univ. (Japan)
Kazunori Katayama, Osaka Univ. (Japan)
Haruyoshi Katayama, Osaka Univ. (Japan)
Makoto Shouho, Osaka Univ. (Japan)
Motoari Ohta, Osaka Univ. (Japan)
Tadayasu Dotani, Institute of Space and Astronautical Science (Japan)
Masanobu Ozaki, Institute of Space and Astronautical Science (Japan)
Katsuji Koyama, Kyoto Univ. (Japan)
Hisamitsu Awaki, Kyoto Univ. (Japan)
Takeshi G. Tsuru, Kyoto Univ. (Japan)
George R. Ricker, Massachusetts Institute of Technology (United States)
Mark W. Bautz, Massachusetts Institute of Technology (United States)
Richard F. Foster, Massachusetts Institute of Technology (United States)
Steven E. Kissel, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 4012:
X-Ray Optics, Instruments, and Missions III
Joachim E. Truemper; Bernd Aschenbach, Editor(s)

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