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Proceedings Paper

PST measurements and wide-angle straylight analyses of the XMM (X-Ray Multi Mirror) telescopes
Author(s): Christian Wuehrer; Reinhard A. Birkl; Peter de Zoeten; Albrecht Frey; Edgar Hoelzle; Wolfgang Ruehe; Daniel de Chambure; Kees van Katwijk
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Paper Abstract

The high throughput X-ray spectroscopy mission XMM is the second `Cornerstone' project in the ESA long term Program for Space Science. This observatory has at its heart three heavily nested Wolter I grazing incidence X-ray telescope. The telescopes are equipped with non-dispersive spectroscopic imaging instruments (EPIC, European Photon Imaging Camera) and medium resolution dispersive spectroscopic instruments (RGS, Reflection Grating Spectrometer). Because of the sensitivity of the XMM instruments X-ray detectors in the visible wavelength range, a high suppression of the visible radiation emitted from out-of-field sources (earth, sun) must be ensured. The straylight reduction capability is quantified by the PST (Point Source Transmittance). The experimental verification of the PST on the XMM flight model mirror modules for off- axis angles between 1 degree(s) and 85 degree(s) is presented in this paper. For the first time a straylight test of a complete telescope was performed in air measuring the telescope PST over a range of 9 orders of magnitude (10-2 to 10-11).

Paper Details

Date Published: 18 July 2000
PDF: 10 pages
Proc. SPIE 4012, X-Ray Optics, Instruments, and Missions III, (18 July 2000); doi: 10.1117/12.391547
Show Author Affiliations
Christian Wuehrer, Dornier Satellitensysteme GmbH (Germany)
Reinhard A. Birkl, Dornier Satellitensysteme GmbH (Germany)
Peter de Zoeten, Dornier Satellitensysteme GmbH (Germany)
Albrecht Frey, Dornier Satellitensysteme GmbH (Germany)
Edgar Hoelzle, Dornier Satellitensysteme GmbH (Germany)
Wolfgang Ruehe, Dornier Satellitensysteme GmbH (Germany)
Daniel de Chambure, European Space Agency/ESTEC (Netherlands)
Kees van Katwijk, European Space Agency/ESTEC (Netherlands)

Published in SPIE Proceedings Vol. 4012:
X-Ray Optics, Instruments, and Missions III
Joachim E. Truemper; Bernd Aschenbach, Editor(s)

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