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Proceedings Paper

Effective masses for small nitrogen concentrations in InGaAsN alloys on GaAs
Author(s): Eric D. Jones; Andrew A. Allerman; Steven R. Kurtz; Ian J. Fritz; Normand A. Modine; Robert M. Sieg; Krishan K. Bajaj; Stanley T. Tozer; Xing Wei
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Paper Abstract

The variation of the value of the linewidth of an excitonic transition in InGaAsN alloys (1% and 2% nitrogen) as a function of hydrostatic pressure using photoluminescence spectroscopy is studied at 4K. The excitonic linewidth increases as a function of pressure until about 100 kbar after which it tends to saturate. This pressure dependent excitonic linewidth is used to derive the pressure variation of the exciton reduced mass using a theoretical formalism based on the premise that the broadening of the excitonic transition is caused primarily by compositional fluctuations in a completely disordered alloy. The linewidth derived ambient pressure masses are compared and found to be in agreement with other mass measurements. The variation of this derived mass is compared with the results from a nearly first-principles approach in which calculations based on the local density approximation to the Kohn-Sham density functional theory are corrected using a small amount of experimental input.

Paper Details

Date Published: 14 July 2000
PDF: 8 pages
Proc. SPIE 3944, Physics and Simulation of Optoelectronic Devices VIII, (14 July 2000); doi: 10.1117/12.391479
Show Author Affiliations
Eric D. Jones, Sandia National Labs. (United States)
Andrew A. Allerman, Sandia National Labs. (United States)
Steven R. Kurtz, Sandia National Labs. (United States)
Ian J. Fritz, Sandia National Labs. (United States)
Normand A. Modine, Sandia National Labs. (United States)
Robert M. Sieg, Sandia National Labs. (United States)
Krishan K. Bajaj, Emory Univ. (United States)
Stanley T. Tozer, Florida State Univ. (United States)
Xing Wei, Florida State Univ. (United States)


Published in SPIE Proceedings Vol. 3944:
Physics and Simulation of Optoelectronic Devices VIII
Rolf H. Binder; Peter Blood; Marek Osinski, Editor(s)

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