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Proceedings Paper

Confocal Raman microscopy for the depth profiling of polymer/polymer and polymer/glass interfaces
Author(s): Chris Sammon; Peter Eaton; Carine Mura; Jack Yarwood
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Paper Abstract

Confocal Raman microscopy has recently developed into a routine tool for the depth profiling of polymeric materials, providing microscopic (molecular) level characterization of surfaces and interfaces. A spatial resolution of 1 - 2 micrometers is easily attainable with modern instrumentation. The use of such an instrument is illustrated by describing recent work from the author's laboratory. (1) The distribution and redistribution of small molecules in polymeric materials. (2) The measurement of concentration gradients at a polymer- polymer interface. (3) The probing of a diffusion of a silane primer to a polymer/glass interface. (4) The quantification of the surface selectivity of chemical treatments for modification of polymer surface properties. It is demonstrated that the technique has tremendous potential as a tool for future materials analysis across a broad area.

Paper Details

Date Published: 6 July 2000
PDF: 12 pages
Proc. SPIE 4129, Subsurface Sensing Technologies and Applications II, (6 July 2000); doi: 10.1117/12.390623
Show Author Affiliations
Chris Sammon, Sheffield Hallam Univ. (United Kingdom)
Peter Eaton, Sheffield Hallam Univ. (United Kingdom)
Carine Mura, Sheffield Hallam Univ. (United Kingdom)
Jack Yarwood, Sheffield Hallam Univ. (United Kingdom)


Published in SPIE Proceedings Vol. 4129:
Subsurface Sensing Technologies and Applications II
Cam Nguyen, Editor(s)

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