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Proceedings Paper

Nondestructive detection of defects in materials using microwaves
Author(s): David Glay; Tuami Lasri; Ahmed Mamouni; Yves Leroy
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Paper Abstract

The most commonly used nondestructive techniques for materials evaluation are ultrasonics, X and (gamma) -rays, infrared and eddy currents methods. In recent years, considerable efforts have been made in applying microwave techniques to test dielectric materials and metals. Therefore, for a few applications microwave methods can be considered alterative approaches to those conventional means. In this paper we consider the microwave near-field determination of the reflection coefficient of dielectric materials and metals, with varying size of flaws, for nondestructive testing purposes. These measurements and simulations are conducted at 35 GHz. We try to demonstrate that microwaves have their place as one tool in the toolbox of the practitioners.

Paper Details

Date Published: 6 July 2000
PDF: 9 pages
Proc. SPIE 4129, Subsurface Sensing Technologies and Applications II, (6 July 2000); doi: 10.1117/12.390622
Show Author Affiliations
David Glay, Institut d'Electronique et de Microelectronique du Nord (France)
Tuami Lasri, Institut d'Electronique et de Microelectronique du Nord (France)
Ahmed Mamouni, Institut d'Electronique et de Microelectronique du Nord (France)
Yves Leroy, Institut d'Electronique et de Microelectronique du Nord (France)


Published in SPIE Proceedings Vol. 4129:
Subsurface Sensing Technologies and Applications II
Cam Nguyen, Editor(s)

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