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Proceedings Paper

Disk inspection system by two-dimensional birefringence distribution measurement
Author(s): Yukitoshi Otani; Natalia M. Dushkina; Toshiyuki Kanno; Toru Yoshizawa
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Paper Abstract

Several kinds of disks, such as DVD, MO and/or CD-R, for the next generation require high quality of plastic surface. Especially their flatness is very important. Here a disk inspection system is proposed using 2D birefringence distribution measurement. Small birefringence is a serious problem that is caused by internal strain, and/or residual stress. Moreover it is possible to observe its molecular orientation. The birefringence measurement is necessary to determine the relative retardation and the azimuthal angle of the fast axis in an optical disk. Several images captured by a CCD camera are enough for one birefringence distribution analysis. Experimental procedure and their results of some famous optical disks are discussed.

Paper Details

Date Published: 6 July 2000
PDF: 4 pages
Proc. SPIE 4081, Optical Storage and Optical Information Processing, (6 July 2000); doi: 10.1117/12.390498
Show Author Affiliations
Yukitoshi Otani, Tokyo Univ. of Agriculture and Technology (Japan)
Natalia M. Dushkina, Tokyo Univ. of Agriculture and Technology (United States)
Toshiyuki Kanno, Fuji Electronic Corporate Research and Development, Ltd. (Japan)
Toru Yoshizawa, Tokyo Univ. of Agriculture and Technology (Japan)


Published in SPIE Proceedings Vol. 4081:
Optical Storage and Optical Information Processing
Han-Ping D. Shieh; Tomas D. Milster, Editor(s)

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