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Proceedings Paper

SPID: a high spectral resolution diffraction-limited camera
Author(s): Michel Tallon; Andre Baranne; Alain Blazit; Francoise-Claude Foy; Renaud Foy; Isabelle Tallon-Bosc; Eric Thiebaut
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Paper Abstract

SPID aims at offering a high spectral resolution in both short-exposure (speckle imaging) and long-exposure (adaptive optics with partial compensation) modes. It offers an adjustable spectral resolution (from 60 up to 3000) in the range 400 - 750 nm. For differential observation of astronomical objects, SPID gives images in two spectral bandwidths at the same time. The width and the central wavelength of each bandwidth can be chosen independently. A high image quality is achieved thanks to a new design derived from a Courtes' monochromator. SPID also includes a wavefront sensor for post-compensation processing. A short-exposure mode allows us to achieve diffraction limited images but with a low signal-to-noise ratio. Depending on the object brightness and on the seeing quality, adaptive optics will allow us to improve significantly the signal-to-noise ratio and sometimes to observe a diffraction limited core in long-exposure mode. Depending on the scientific goal, the availability of the two modes will drive the best choice. The current status of SPID is presented together with first results obtained at CFHT in the short-exposure mode.

Paper Details

Date Published: 7 July 2000
PDF: 9 pages
Proc. SPIE 4007, Adaptive Optical Systems Technology, (7 July 2000); doi: 10.1117/12.390390
Show Author Affiliations
Michel Tallon, Ctr. de Recherche Astronomique de Lyon (France)
Andre Baranne, Observatoire de Marseille (France)
Alain Blazit, Observatoire de la Cote d'Azur (France)
Francoise-Claude Foy, Ctr. de Recherche Astronomique de Lyon (France)
Renaud Foy, Ctr. de Recherche Astronomique de Lyon (France)
Isabelle Tallon-Bosc, Ctr. de Recherche Astronomique de Lyon (France)
Eric Thiebaut, Ctr. de Recherche Astronomique de Lyon (France)


Published in SPIE Proceedings Vol. 4007:
Adaptive Optical Systems Technology
Peter L. Wizinowich, Editor(s)

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