Share Email Print
cover

Proceedings Paper

Absolute metrology for the Very Large Telescope Interferometer (VLTI)
Author(s): Yves Salvade; Alain Courteville; Rene Daendliker
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The Phase Reference Imaging and Micro-arcsecond Astrometry facility (PRIMA) requires an accurate metrology system to measure the internal optical path difference (OPD) with an accuracy to 5 nm over the baseline length of the telescopes (up to 130 m). The actual concept of PRIMA plans to use an incremental metrology for measuring the internal OPD, combined with a zero-OPD calibration. As a future improvement of the PRIMA Laser Metrology System, we propose in this paper an absolute metrology system based on multiple-wavelength interferometry. It could reduce the complexity of the internal optical path calibration scheme and lead to an accurate determination of the baseline length, thus increasing the overall performance of PRIMA.

Paper Details

Date Published: 5 July 2000
PDF: 8 pages
Proc. SPIE 4006, Interferometry in Optical Astronomy, (5 July 2000); doi: 10.1117/12.390235
Show Author Affiliations
Yves Salvade, Univ. of Neuchatel (Switzerland)
Alain Courteville, Univ. of Neuchatel (Switzerland)
Rene Daendliker, Univ. of Neuchatel (Switzerland)


Published in SPIE Proceedings Vol. 4006:
Interferometry in Optical Astronomy
Pierre J. Lena; Andreas Quirrenbach, Editor(s)

© SPIE. Terms of Use
Back to Top