Share Email Print

Proceedings Paper

Metrology for phase-referenced imaging and narrow-angle astrometry with the VLTI
Author(s): Samuel A. Leveque
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The capability to perform Phased-Reference Imaging and Narrow-Angle Astrometry with the VLTI will be given by the PRIMA instrument, which is based on the simultaneous observation of two celestial objects. A highly accurate metrology system is required to monitor the optical path followed by the two objects inside the VLTI. In the framework of PRIMA, this paper reviews the requirements as well as the constraints for such a metrology system and discusses its implementation.

Paper Details

Date Published: 5 July 2000
PDF: 9 pages
Proc. SPIE 4006, Interferometry in Optical Astronomy, (5 July 2000); doi: 10.1117/12.390231
Show Author Affiliations
Samuel A. Leveque, European Southern Observatory (Germany)

Published in SPIE Proceedings Vol. 4006:
Interferometry in Optical Astronomy
Pierre J. Lena; Andreas Quirrenbach, Editor(s)

© SPIE. Terms of Use
Back to Top