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Proceedings Paper

Planar integrated optics contribution to instrumention for interferometry
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Paper Abstract

The aim of this presentation is to expose how astronomical instrumentation for single mode interferometry can benefit from planar optics intrinsic properties. Components based on this technology, initially developed for telecommunication and micro-sensors, are routinely produced by the industry.

Paper Details

Date Published: 5 July 2000
PDF: 12 pages
Proc. SPIE 4006, Interferometry in Optical Astronomy, (5 July 2000); doi: 10.1117/12.390178
Show Author Affiliations
Pierre Y. Kern, Observatoire de Grenoble (France)
Jean-Philippe Berger, Ecole nationale superieure d'electronique et de radioelectricite de Grenoble (United States)
Pierre Haguenauer, Observatoire de Grenoble and Capteurs et Systemes Optiques de Mesures (France)
Fabien Malbet, Observatoire de Grenoble (France)
Karine Perraut-Rousselet, Observatoire de Grenoble (France)

Published in SPIE Proceedings Vol. 4006:
Interferometry in Optical Astronomy
Pierre J. Lena; Andreas Quirrenbach, Editor(s)

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