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Proceedings Paper

GAIA testbench: monitoring the basic angle with micro-arcsecond accuracy
Author(s): Bart Snijders; Pieter Kappelhof; Ben C. Braam; H. J. P. Vink; Peter Verhoeff; Bertrand Calvel; Frederic Safa
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Paper Abstract

A test-bench simulating the GAIA metrology system has been developed by TNO-TPD. The lines-of-sight of the two telescopes in the GAIA instrument are separated by an angle (called `basic angle') of about 106 degrees. The basic angle stability should be within 10 microarcsecond rms over the satellite revolution period of 3 hours, or should be at least known with this accuracy. The basic angle is monitored by a high-precision interferometric laser metrology system.

Paper Details

Date Published: 5 July 2000
PDF: 12 pages
Proc. SPIE 4006, Interferometry in Optical Astronomy, (5 July 2000); doi: 10.1117/12.390172
Show Author Affiliations
Bart Snijders, TNO Institute of Applied Physics (Netherlands)
Pieter Kappelhof, TNO Institute of Applied Physics (Netherlands)
Ben C. Braam, TNO Institute of Applied Physics (Netherlands)
H. J. P. Vink, TNO Institute of Applied Physics (Netherlands)
Peter Verhoeff, TNO Institute of Applied Physics (Netherlands)
Bertrand Calvel, Matra Marconi Space (France)
Frederic Safa, Matra Marconi Space (France)

Published in SPIE Proceedings Vol. 4006:
Interferometry in Optical Astronomy
Pierre J. Lena; Andreas Quirrenbach, Editor(s)

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