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Proceedings Paper

Certifiable database generation for SVS
Author(s): Jens Schiefele; Dejan Damjanovic; Wolfgang Kubbat
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Paper Abstract

In future aircraft cockpits SVS will be used to display 3D physical and virtual information to pilots. A review of prototype and production Synthetic Vision Displays (SVD) from Euro Telematic, UPS Advanced Technologies, Universal Avionics, VDO-Luftfahrtgeratewerk, and NASA, are discussed. As data sources terrain, obstacle, navigation, and airport data is needed, Jeppesen-Sanderson, Inc. and Darmstadt Univ. of Technology currently develop certifiable methods for acquisition, validation, and processing methods for terrain, obstacle, and airport databases. The acquired data will be integrated into a High-Quality Database (HQ-DB). This database is the master repository. It contains all information relevant for all types of aviation applications. From the HQ-DB SVS relevant data is retried, converted, decimated, and adapted into a SVS Real-Time Onboard Database (RTO-DB). The process of data acquisition, verification, and data processing will be defined in a way that allows certication within DO-200a and new RTCA/EUROCAE standards for airport and terrain data. The open formats proposed will be established and evaluated for industrial usability. Finally, a NASA-industry cooperation to develop industrial SVS products under the umbrella of the NASA Aviation Safety Program (ASP) is introduced. A key element of the SVS NASA-ASP is the Jeppesen lead task to develop methods for world-wide database generation and certification. Jeppesen will build three airport databases that will be used in flight trials with NASA aircraft.

Paper Details

Date Published: 23 June 2000
PDF: 11 pages
Proc. SPIE 4023, Enhanced and Synthetic Vision 2000, (23 June 2000); doi: 10.1117/12.389360
Show Author Affiliations
Jens Schiefele, Darmstadt Univ. of Technology (Germany)
Dejan Damjanovic, Jeppesen-Sanderson, Inc. (United States)
Wolfgang Kubbat, Darmstadt Univ. of Technology (Germany)


Published in SPIE Proceedings Vol. 4023:
Enhanced and Synthetic Vision 2000
Jacques G. Verly, Editor(s)

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