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Proceedings Paper

Degree of patterning performance (DOPP) at low K lithography
Author(s): Donggyu Yim; Seung-Hyuk Lee; Myung-Goon Gil; Young-Mog Ham; Bong-Ho Kim; Ki-Ho Baik
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Paper Abstract

In this study, we will introduce a new definition, as 'Degree of Patterning Performance (DOPP)' for analyzing process capability. DOPP represents the total performance, which can estimate whether it could be available to adapt any device ona certain integration process. The degree of difficulty on some projects can be represented by DOPP, which considers design rule, field size, mask error, lens aberration, illumination imperfection, resist performance, and the others. Via DOPP, one can estimate whether some project can be available on mass production or not, and machine performance is normal or not. And also, one can quantitatively analyze how effective several causes of CD variation are on total patterning performance respectively. The simple DOPP metric can be used widely on various situations, which will be introduced in detail on this paper.

Paper Details

Date Published: 5 July 2000
PDF: 10 pages
Proc. SPIE 4000, Optical Microlithography XIII, (5 July 2000); doi: 10.1117/12.388963
Show Author Affiliations
Donggyu Yim, Hyundai Electronics Industries Co., Ltd. (South Korea)
Seung-Hyuk Lee, Hyundai Electronics Industries Co., Ltd. (South Korea)
Myung-Goon Gil, Hyundai Electronics Industries Co., Ltd. (South Korea)
Young-Mog Ham, Hyundai Electronics Industries Co., Ltd. (South Korea)
Bong-Ho Kim, Hyundai Electronics Industries Co., Ltd. (South Korea)
Ki-Ho Baik, Hyundai Electronics Industries Co., Ltd. (South Korea)


Published in SPIE Proceedings Vol. 4000:
Optical Microlithography XIII
Christopher J. Progler, Editor(s)

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