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Proceedings Paper

Atomic force microscopy observations of domains in fine-grain PZT ceramics
Author(s): Zuoyi Wang; Qing Jiang; John E. Blendell; Grady S. White
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Paper Abstract

This study demonstrates that AFM is capable of observing domains of several tens of nanometers in fine grain PZT ceramics. The investigators have also shown that carefully conducted light polishing can result in no significant disturbance to domain patterns in hard PZT ceramics.

Paper Details

Date Published: 19 June 2000
PDF: 11 pages
Proc. SPIE 3984, Smart Structures and Materials 2000: Mathematics and Control in Smart Structures, (19 June 2000); doi: 10.1117/12.388790
Show Author Affiliations
Zuoyi Wang, Univ. of Nebraska/Lincoln (United States)
Qing Jiang, Univ. of California/Riverside (United States)
John E. Blendell, National Institute of Standards and Technology (United States)
Grady S. White, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 3984:
Smart Structures and Materials 2000: Mathematics and Control in Smart Structures
Vasundara V. Varadan, Editor(s)

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