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Proceedings Paper

Improvement of pyroelectric vidicon performance by trace and retrace scanning raster matching
Author(s): Vitaliy Goj; Zenon D. Hrytskiv; Petr Kondratov
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Paper Abstract

Thermovision systems based on the pyroelectric vidicon (PV) are low-cost non-cooled devices for image creation in far infrared range of spectrum. For such systems it is necessary to form the positive pedestal charge to prevent PV from blanking and to decrease electron beam delay. Secondary emission pedestal mode (SEPM) is most frequently used for this purpose. It provides pedestal creation during retrace time of horizontal scanning. This paper is dedicated to examining of the SEPM influence on pyroelectric vidicon focusing and deflection mode changes, analysis results of the influence and finding possible ways to correct them. It is shown that SEPM causes deflection decreasing during retrace raster, performed estimation shows that trace and retrace rasters are considerably different. The trace and retrace rasters matching enables to improve the power parameters of the scanning and to increase target commutation time (sensitivity) and number of active scanning lines (spatial resolution). The methods of the trace and retrace raster matching are discussed. The advantages and shortcomings of these methods are pointed out. An estimation of thermovision system parameters improvement is calculated. The obtained results provide a good basis for designing low- cost portable thermovision systems with improved power parameters, resolution and sensitivity.

Paper Details

Date Published: 14 June 2000
PDF: 6 pages
Proc. SPIE 4148, Optoelectronic and Hybrid Optical/Digital Systems for Image and Signal Processing, (14 June 2000); doi: 10.1117/12.388450
Show Author Affiliations
Vitaliy Goj, Lviv Polytechnic State Univ. (Ukraine)
Zenon D. Hrytskiv, Lviv Polytechnic State Univ. (Ukraine)
Petr Kondratov, Research and Design Institute Elvit (Ukraine)


Published in SPIE Proceedings Vol. 4148:
Optoelectronic and Hybrid Optical/Digital Systems for Image and Signal Processing
Simon B. Gurevich; Zinovii T. Nazarchuk; Leonid I. Muravsky, Editor(s)

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