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Proceedings Paper

Progressions in deep-ultraviolet bottom antireflective coatings
Author(s): George E. Bailey; Nicholas K. Eib; Earnest C. Murphy
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Paper Abstract

Deep ultraviolet (DUV) bottom anti-reflective coating (BARC)- to-resist compatibility is a key component in process optimization. In addition to the reduction of optical interference effects, BARC's also improve CD uniformity by preventing substrate contamination. However, if the BARC is not compatible with the resist, it can create adverse affects. If the acidity level of the BARC is not tuned to the resist for example, the profiles will foot or undercut, or if the BARC-to-resist developer interactions are not considered, high levels of post-develop defects will most likely occur. Etch selectivity, topography conformality and bowl/drain compatibility are other factors to consider when selecting a BARC. This paper follows the progressions of the leading DUV BARC's for Acetal-based resist systems and addresses the problems that could be encountered with implementing a BARC process. From DUV32 to the topography-conforming DUV42 and finally to the profile-enhancing DUV44, the 248 nm BARC's are continually evolving to resolve the BARC-to-resist compatibility issues.

Paper Details

Date Published: 23 June 2000
PDF: 14 pages
Proc. SPIE 3999, Advances in Resist Technology and Processing XVII, (23 June 2000); doi: 10.1117/12.388256
Show Author Affiliations
George E. Bailey, LSI Logic Corp. (United States)
Nicholas K. Eib, LSI Logic Corp. (United States)
Earnest C. Murphy, Brewer Science, Inc. (United States)

Published in SPIE Proceedings Vol. 3999:
Advances in Resist Technology and Processing XVII
Francis M. Houlihan, Editor(s)

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