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Proceedings Paper

Microscopic observation of laser-induced forward transfer process by two-dimensional laser-induced fluorescence technique
Author(s): Yoshiki Nakata; Tatsuo Okada; Mitsuo Maeda
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Paper Abstract

The behaviors of atomic particles and droplets in laser-induced forward transfer (LIFT) process were observed by two-dimensional laser-induced fluorescence (2D-LIF) technique and by thermal emission detection. The behavior of the ejected particles in gas phase was observed with different parameters such as ablation laser energy, film thickness, gas pressure. The interaction of the particles with substrate was also observed.

Paper Details

Date Published: 7 June 2000
PDF: 12 pages
Proc. SPIE 3933, Laser Applications in Microelectronic and Optoelectronic Manufacturing V, (7 June 2000); doi: 10.1117/12.387584
Show Author Affiliations
Yoshiki Nakata, Kyushu Univ. (Japan)
Tatsuo Okada, Kyushu Univ. (Japan)
Mitsuo Maeda, Kyushu Univ. (Japan)


Published in SPIE Proceedings Vol. 3933:
Laser Applications in Microelectronic and Optoelectronic Manufacturing V
Henry Helvajian; Koji Sugioka; Malcolm C. Gower; Jan J. Dubowski, Editor(s)

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