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Proceedings Paper

Effects of roughness in the side walls of optical waveguides on propagation loss
Author(s): Kunihiko Asama; Tadashi Warikai; Hiroaki Kurokawa; Michiko Kuroda; Hiroyuki Kasai
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Paper Abstract

In this study we analyze the optical propagation properties due to the roughness of side walls in waveguides (core regions), which is inherent in the patterning processes such as RIE, UV curing and so on. In the analysis we evaluate the increase in loss due to the side-wall roughness, where the width of waveguides vary sinusoidally and randomly in the models. As a parameter, we pay attention to the relative refractive index different between the core and clad regions. The Finite-Difference Beam Propagation Method is used in the simulation. It is found that the increase in loss depends on the period varied in waveguides and the maximum value of loss is about 0.2 dB/cm in present conditions. However the large value of loss more than 1 dB/cm appears noticeably in some specific periods, and this is discussed using the Brillouin diagram.

Paper Details

Date Published: 24 May 2000
PDF: 6 pages
Proc. SPIE 4089, Optics in Computing 2000, (24 May 2000); doi: 10.1117/12.386777
Show Author Affiliations
Kunihiko Asama, Tokyo Univ. of Technology (Japan)
Tadashi Warikai, Tokyo Univ. of Technology (Japan)
Hiroaki Kurokawa, Tokyo Univ. of Technology (Japan)
Michiko Kuroda, Tokyo Univ. of Technology (Japan)
Hiroyuki Kasai, Tokyo Univ. of Technology (Japan)


Published in SPIE Proceedings Vol. 4089:
Optics in Computing 2000
Roger A. Lessard; Tigran V. Galstian, Editor(s)

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