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Proceedings Paper

DSPI technique for nanometer vibration mode measurement
Author(s): Kaiduan Yue; Shuhai Jia; Yushan Tan
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Paper Abstract

A time-average DSPI method for nanometer vibration mode measurement is presented in this paper. The phase continuous scan technique is combined with the Bessel fringe-shifting technique to quantitatively analyze the vibration mode by time-average DSPI is used in measurement system. Through the phase continuous scan, the background and speckle items are completely eliminated, which improves the fringe quality and enhances the signal-to-noise ratio of interferogram. There is no need to calibrate the optical phase-shifter exactly in this method. The anti-disturbance capability of this method is higher than that of the phase-stepping technique, so it is robust and easy to be used. In the vibration measurement system, the speckle average technology is used, so the high quality measuring results are obtained.

Paper Details

Date Published: 22 May 2000
PDF: 5 pages
Proc. SPIE 4072, Fourth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications, (22 May 2000); doi: 10.1117/12.386740
Show Author Affiliations
Kaiduan Yue, Xian Jiaotong Univ. (China)
Shuhai Jia, Xian Jiaotong Univ. (China)
Yushan Tan, Xian Jiaotong Univ. (China)


Published in SPIE Proceedings Vol. 4072:
Fourth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications
Enrico Primo Tomasini, Editor(s)

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