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Proceedings Paper

Characterization of wafer-induced shift on overlay target using post- etch artifact wafers
Author(s): Alan S. Wong
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Paper Abstract

In this paper, I will present a methodology of using post etch wafers with multiple overlay targets to characterize the Wafer Induced Shift (WIS). The overlay targets consists of both embedded and exposed structures that represent the post develop and post etch measurements respectively. This methodology provides a metric to quantify the WIS in the process, defined as the difference between post develop measurement, or develop check (DC), and post etch measurement, or final check (FC). It also allows us to characterize the overlay tool, the overlay target and the process variability altogether and to improve the correlation between DC and FC measurements.

Paper Details

Date Published: 2 June 2000
PDF: 7 pages
Proc. SPIE 3998, Metrology, Inspection, and Process Control for Microlithography XIV, (2 June 2000); doi: 10.1117/12.386532
Show Author Affiliations
Alan S. Wong, Intel Corp. (United States)

Published in SPIE Proceedings Vol. 3998:
Metrology, Inspection, and Process Control for Microlithography XIV
Neal T. Sullivan, Editor(s)

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