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Proceedings Paper

Optical characterization in the vacuum ultraviolet with variable angle spectroscopic ellipsometry: 157 nm and below
Author(s): James N. Hilfiker; Bhanwar Singh; Ron A. Synowicki; Corey L. Bungay
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Paper Abstract

As device feature sizes shrink below 0.18 micrometer, shorter wavelength exposure tools are being investigated to meet the requirements for higher resolution. Understanding the optical properties of thin films and substrate materials at short wavelengths (193 nm, 157 nm, and shorter) will be necessary to develop the lithographic process. Variable Angle Spectroscopic Ellipsometry (VASE) offers nondestructive and precise measurement of thin film thickness and refractive index in the wavelength range from 146 nm to 1700 nm. VASE measurements provide a complete description of the thin film optical properties, which can be used to track process changes or variations in sample structure. Recent hardware innovations have extended VASE into the vacuum ultraviolet to meet lithography requirements at 157 nm.

Paper Details

Date Published: 2 June 2000
PDF: 9 pages
Proc. SPIE 3998, Metrology, Inspection, and Process Control for Microlithography XIV, (2 June 2000); doi: 10.1117/12.386495
Show Author Affiliations
James N. Hilfiker, J.A. Woollam Co., Inc. (United States)
Bhanwar Singh, Advanced Micro Devices, Inc. (United States)
Ron A. Synowicki, J.A. Woollam Co., Inc. (United States)
Corey L. Bungay, J.A. Woollam Co., Inc. (United States)

Published in SPIE Proceedings Vol. 3998:
Metrology, Inspection, and Process Control for Microlithography XIV
Neal T. Sullivan, Editor(s)

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