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Proceedings Paper

Degradation mechanisms in organic light-emitting diodes
Author(s): E. Langlois; D. Wang; Jun Shen; W. A. Barrow; Patrick J. Green; Ching W. Tang; J. Shi
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Paper Abstract

Experimental and theoretical results are presented on the lifetime of organic light emitting diodes (OLEDs) for active matrix display applications. DC aging tests on the OLEDs show that the driving voltage increases under forward bias and then reverse its trend when the bias polarity is reversed, which reproduce our previous test under AC conditions. Furthermore, the voltage seems to be able to relax slowly toward its initial value when the device bias is reset to zero after a long forward bias stress. The mobile ions are proposed to be the origin of the observed voltage shifts. By solving a system of transient equations governing the mobile ion motion under an external field, we obtained the transient mobile ion distributions and their contribution to the driving voltage. Several cases were studied. We found that the mobile ion model with reasonable assumptions could very well explain the experimental results. Furthermore, by comparison between the data and simulation, the possibility of the initial mobile ion sources can be narrowed.

Paper Details

Date Published: 19 May 2000
PDF: 6 pages
Proc. SPIE 3939, Organic Photonic Materials and Devices II, (19 May 2000); doi: 10.1117/12.386370
Show Author Affiliations
E. Langlois, Arizona State Univ. (United States)
D. Wang, Arizona State Univ. (United States)
Jun Shen, Arizona State Univ. (United States)
W. A. Barrow, Planar Systems, Inc. (United States)
Patrick J. Green, Planar Systems, Inc. (United States)
Ching W. Tang, Eastman Kodak Co. (United States)
J. Shi, Eastman Kodak Co. (United States)

Published in SPIE Proceedings Vol. 3939:
Organic Photonic Materials and Devices II
Donal D. C. Bradley; Bernard Kippelen, Editor(s)

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