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Proceedings Paper

Influence of process variables on the microstructure and electrical properties of low-voltage ZnO varistor
Author(s): Congchun Zhang; Dong-xiang Zhou; Shuping Gong
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Paper Abstract

The effects of process variables, such as sintering temperature, cooling rate, calcination, balling time on the microstructure and electrical properties of the low voltage ZnO varistor have been investigated. There exists a maximum sintering temperature when the breakdown field is the lowest. The results provide information about the grain size control to fabricate low voltage ZnO varistor, as well as the relationship between the microstructure and the varistor performance. We discussed the sintering temperature dependence of breakdown field in terms of the formation rate of grain core and grain growth rate.

Paper Details

Date Published: 9 May 2000
PDF: 4 pages
Proc. SPIE 4077, International Conference on Sensors and Control Techniques (ICSC 2000), (9 May 2000); doi: 10.1117/12.385530
Show Author Affiliations
Congchun Zhang, Huazhong Univ. of Science and Technology (China)
Dong-xiang Zhou, Huazhong Univ. of Science and Technology (China)
Shuping Gong, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 4077:
International Conference on Sensors and Control Techniques (ICSC 2000)
Desheng Jiang; Anbo Wang, Editor(s)

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