Share Email Print
cover

Proceedings Paper

Advanced CCD linescan sensor for high-contrast film scanning
Author(s): Stacy R. Kamasz; Nixon O; Wolfgang Steinbach; Thomas Graen; Brian Benwell
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

DALSA and Philips Digital Video Systems have developed a high performance pinned-photo-diode CCD linescan sensor for scanning of motion picture film. This application requires a sensor with performance optimized for a high dynamic range optical input, with high speed operation. The sensor is named the IL-P2-2048. It is based on the existing DALSA IL- P1-2048 linescan sensor design with a number of significant changes--the full well has been increased to in excess of 300,000 electrons, with a maximum video swing of more than 1000 mV with two bi-directional outputs operating at > 21 MHz video rate. Of importance is the introduction of pinned- photo diode pixels (10 X 10 micron pitch) which possess extremely low fixed pattern noise, low pixel-response non- uniformity, and low image lag. The sensor also has pixel select gates to enable the user to select the full resolution or a reduced number of pixels for use in different imaging formats; the pixel selection is nevertheless dynamic and can be user selectable. The output circuitry has excellent linearity from a few mV to the full signal swing of 1000 mV. In this paper the authors present the design and test results of the sensor.

Paper Details

Date Published: 15 May 2000
PDF: 8 pages
Proc. SPIE 3965, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications, (15 May 2000); doi: 10.1117/12.385469
Show Author Affiliations
Stacy R. Kamasz, DALSA Inc. (Canada)
Nixon O, DALSA Inc. (Canada)
Wolfgang Steinbach, Philips Digital Video Systems (Germany)
Thomas Graen, Philips Digital Video Systems (Germany)
Brian Benwell, DALSA Inc. (Canada)


Published in SPIE Proceedings Vol. 3965:
Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications
Morley M. Blouke; Nitin Sampat; Thomas Yeh; Nitin Sampat; George M. Williams; Thomas Yeh, Editor(s)

© SPIE. Terms of Use
Back to Top