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Proceedings Paper

Use of a Nyquist chart for camera system evaluation
Author(s): Scott Patrick Campbell
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Paper Abstract

A novel method for the determination of a camera system's overall performance is described. This method involves the use of new form of test chart, termed a Nyquist chart. A Nyquist chart is a deterministic pattern of bright and dark structures that are imaged onto an image sensor array at the time sensor array's (spatial) Nyquist frequency. Camera system parameters such as MTF at the Nyquist frequency, distortion, pixel aspect ratio, color filter array layout, color balancing, field of view, relative illumination, depth of focus, and Petzval curvature can be readily determined.

Paper Details

Date Published: 15 May 2000
PDF: 5 pages
Proc. SPIE 3965, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications, (15 May 2000); doi: 10.1117/12.385468
Show Author Affiliations
Scott Patrick Campbell, Photobit Corp. (United States)


Published in SPIE Proceedings Vol. 3965:
Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications
Morley M. Blouke; Nitin Sampat; Thomas Yeh; Nitin Sampat; George M. Williams; Thomas Yeh, Editor(s)

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