Share Email Print
cover

Proceedings Paper

Measurements of the subpixel sensitivity for a backside-illuminated CCD
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

This paper presents results from a measurement program designed to investigate the variations in sensitivity of focal plane arrays on a sub-pixel scale. High-resolution measurements have previously been reported for a front- illuminated CCD device. New measurements are now provided on the sensitivity variations with in a single pixel of a backside-illuminated CCD. The measurements were made using a stable broadband light source and two high-precision translation stages. The pixel scans have been performed using 4 different filters (3 broadband and 1 narrowband). The results for each spectral region are presented.19

Paper Details

Date Published: 15 May 2000
PDF: 9 pages
Proc. SPIE 3965, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications, (15 May 2000); doi: 10.1117/12.385467
Show Author Affiliations
Albert Piterman, Rochester Institute of Technology (United States)
Zoran Ninkov, Rochester Institute of Technology (United States)


Published in SPIE Proceedings Vol. 3965:
Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications
Nitin Sampat; Thomas Yeh; Morley M. Blouke; Nitin Sampat; George M. Williams; Thomas Yeh, Editor(s)

© SPIE. Terms of Use
Back to Top