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Proceedings Paper

Low-noise readout using active reset for CMOS APS
Author(s): Boyd A. Fowler; Michael Godfrey; Janusz Balicki; John Canfield
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Paper Abstract

Pixel reset noise sets the fundamental detection limit on photodiode based CMOS image sensors. Reset noise in standard active pixel sensor (APS) is well understood and is of order kT/C. In this paper we present a new technique for resetting photodiodes, called active reset, which reduces reset noise without adding lag. Active reset can be applied to standard APS. Active reset uses bandlimiting and capacitive feedback to reduce reset noise. This paper discusses the operation of an active reset pixel, and presents an analysis of lag and noise. Measured results from a 6 transistor per pixel 0.35 micrometers CMOS implementation are presented. Measured results show that reset noise can be reduced to less than kT/18C using active reset. We find that theory simulation and measured results all match closely.

Paper Details

Date Published: 15 May 2000
PDF: 10 pages
Proc. SPIE 3965, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications, (15 May 2000); doi: 10.1117/12.385430
Show Author Affiliations
Boyd A. Fowler, Pixel Devices International Inc. (United States)
Michael Godfrey, Pixel Devices International Inc. (United States)
Janusz Balicki, Pixel Devices International Inc. (United States)
John Canfield, Pixel Devices International Inc. (United States)


Published in SPIE Proceedings Vol. 3965:
Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications
Morley M. Blouke; Nitin Sampat; Thomas Yeh; Nitin Sampat; George M. Williams; Thomas Yeh, Editor(s)

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