Share Email Print
cover

Proceedings Paper

Technology assessment of MEMS for NDE and condition-based maintenance
Author(s): George A. Matzkanin
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Interest continues to increase in applying MEMS technology for advancing both NDE and condition based maintenance (CBM) applications. The advantages of drastic size and weight reduction of MEMS enable consideration of developing low-cost, high-performance, ultra-portable, MEMS-based diagnostic systems for field inspections. For system health monitoring, it is feasible to envision permanently attached, distributed networks of micro-sensors on structural surfaces, e.g, acoustic emission sensors, accelerometers, strain gages, and pressure sensors. In addition, embedded MEMS based sensors could be used for continuous health monitoring of structures and systems. Under sponsorship of the Naval Air Warfare Center, NTIAC has performed an extensive review of the current status of MEMS technology and an assessment of how this technology can be used in applications of NDE and CBM. This presentation will provide a summary of the results of this technology assessment and describe recent MEMS developments in ultrasonics, eddy current, structural health monitoring and the medical field with potential for application to NDE and CBM.

Paper Details

Date Published: 5 May 2000
PDF: 10 pages
Proc. SPIE 3994, Nondestructive Evaluation of Aging Aircraft, Airports, and Aerospace Hardware IV, (5 May 2000); doi: 10.1117/12.385031
Show Author Affiliations
George A. Matzkanin, Texas Research Institute Austin, Inc. (United States)


Published in SPIE Proceedings Vol. 3994:
Nondestructive Evaluation of Aging Aircraft, Airports, and Aerospace Hardware IV
Ajit K. Mal, Editor(s)

© SPIE. Terms of Use
Back to Top