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Proceedings Paper

New ultrasound pulse-echo method for measuring the thickness of thin membranes
Author(s): Sidney Leeman; Andrew J. Healey; Eduardo Tavares Costa
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Paper Abstract

This communication presents a new method for measuring the thickness of thin membranes with pulse-echo ultrasound. The method is based on a consideration of the structure of the interference of the two echoes from the sides of the membrane. Essentially, it is the interference between these two echoes that gives rise to poor thickness estimation. The new method, which is explained in detail, proceeds from a consideration of the zeros of the echo signal in the complex frequency domain. Measurements with the new technique are compared with two other methods: the time-separation of echo envelopes, and a cross-correlation method. The analysis is presented with both simulated and real (laboratory) data. The effect of noise is taken into account in the laboratory data. This new method is shown to be capable of measuring sub-wavelength membrane thicknesses with excellent precision. The ultrasound rf signal is required, but a substantial improvement over existing techniques is gained.

Paper Details

Date Published: 25 April 2000
PDF: 7 pages
Proc. SPIE 3977, Medical Imaging 2000: Physics of Medical Imaging, (25 April 2000); doi: 10.1117/12.384543
Show Author Affiliations
Sidney Leeman, King's College London (United Kingdom)
Andrew J. Healey, Nycomed Imaging AS (Norway)
Eduardo Tavares Costa, State Univ. of Campinas (Brazil)

Published in SPIE Proceedings Vol. 3977:
Medical Imaging 2000: Physics of Medical Imaging
James T. Dobbins; John M. Boone, Editor(s)

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