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Proceedings Paper

High-resolution direct-detection x-ray imagers
Author(s): Robert A. Street; Steve E. Ready; Jeffrey T. Rahn; Marcelo Mulato; Kanai S. Shah; Paul R. Bennett; Ping Mei; Jeng-Ping Lu; Raj B. Apte; Jackson Ho; Koenraad Van Schuylenbergh; Francesco Lemmi; James B. Boyce; Per Nylen; Michael M. Schieber; Haim Hermon
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Paper Abstract

We report on a-Si direct detection x-ray image sensors with polycrystalline PbI2, and more recently with HgI2. The arrays have 100 micron pixel size and, we study those aspects of the detectors that mainly determine the DQE, such as sensitivity, effective fill factor, dark current noise, noise power spectrum, and x-ray absorption. Line spread function data show that in the PbI2 arrays, most of the signal in the gap between pixels is collected, which is important for high,DQE. The leakage current noise agrees with the expected shot noise value with only a small enhancement at high bias voltages. The noise power spectrum under x-ray exposure is reported and compared to the spatial resolution information. The MTF is close to the ideal sinc function, but is reduced by the contribution of K-fluorescence in the PbI2 film for which we provide new experimental evidence. The role of noise power aliasing in the DQE and the effect of slight image spreading are discussed. Initial studies of HgI2 as the photoconductor material show very promising results with high x-ray sensitivity and low leakage current.

Paper Details

Date Published: 25 April 2000
PDF: 11 pages
Proc. SPIE 3977, Medical Imaging 2000: Physics of Medical Imaging, (25 April 2000); doi: 10.1117/12.384516
Show Author Affiliations
Robert A. Street, Xerox Palo Alto Research Ctr. (United States)
Steve E. Ready, Xerox Palo Alto Research Ctr. (United States)
Jeffrey T. Rahn, Xerox Palo Alto Research Ctr. (United States)
Marcelo Mulato, Xerox Palo Alto Research Ctr. (United States)
Kanai S. Shah, Radiation Monitoring Devices, Inc. (United States)
Paul R. Bennett, Radiation Monitoring Devices, Inc. (United States)
Ping Mei, Xerox Palo Alto Research Ctr. (United States)
Jeng-Ping Lu, Xerox Palo Alto Research Ctr. (United States)
Raj B. Apte, Xerox Palo Alto Research Ctr. (United States)
Jackson Ho, Xerox Palo Alto Research Ctr. (United States)
Koenraad Van Schuylenbergh, Xerox Palo Alto Research Ctr. (United States)
Francesco Lemmi, Xerox Palo Alto Research Ctr. (United States)
James B. Boyce, Xerox Palo Alto Research Ctr. (United States)
Per Nylen, Univ. of Stockholm (United States)
Michael M. Schieber, Hebrew Univ. of Jerusalem (Israel)
Haim Hermon, Hebrew Univ. of Jerusalem (Israel)


Published in SPIE Proceedings Vol. 3977:
Medical Imaging 2000: Physics of Medical Imaging
James T. Dobbins; John M. Boone, Editor(s)

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