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Proceedings Paper

Experimental evaluation of a-Se and CdTe flat-panel x-ray detectors for digital radiography and fluoroscopy
Author(s): Susumu Adachi; Naoyuki Hori; Kenji Sato; Satoshi Tokuda; Toshiyuki Sato; Kazuhiro Uehara; Yoshihiro Izumi; Hisashi Nagata; Youji Yoshimura; Satoshi Yamada
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Paper Abstract

Described are two types of direct-detection flat-panel X-ray detectors utilizing amorphous selenium (a-Se) and cadmium telluride (CdTe). The a-Se detector is fabricated using direct deposition onto a thin film transistor (TFT) substrate, whereas the CdTe detector is fabricated using a novel hybrid method, in which CdTe is pre-deposited onto a glass substrate and then connected to a TFT substrate. The detector array format is 512 X 512 with a pixel pitch of 150 micrometer. The imaging properties of both detectors have been evaluated with respect to X-ray sensitivity, lag, spatial resolution, and detective quantum efficiency (DQE). The modulation transfer functions (MTFs) measured at 1 lp/mm were 0.96 for a- Se and 0.65 for CdTe. The imaging lags after 33 ms were about 4% for a-Se and 22% for CdTe. The DQE values measured at zero spatial frequency were 0.75 for a-Se and 0.22 for CdTe. The results indicate that the a-Se and CdTe detectors have high potential as new digital X-ray imaging devices for both radiography and fluoroscopy.

Paper Details

Date Published: 25 April 2000
PDF: 10 pages
Proc. SPIE 3977, Medical Imaging 2000: Physics of Medical Imaging, (25 April 2000); doi: 10.1117/12.384511
Show Author Affiliations
Susumu Adachi, Shimadzu Co. (Japan)
Naoyuki Hori, Shimadzu Co. (Japan)
Kenji Sato, Shimadzu Co. (Japan)
Satoshi Tokuda, Shimadzu Co. (Japan)
Toshiyuki Sato, Shimadzu Co. (Japan)
Kazuhiro Uehara, Sharp Co. (Japan)
Yoshihiro Izumi, Sharp Co. (Japan)
Hisashi Nagata, Sharp Co. (Japan)
Youji Yoshimura, Sharp Co. (Japan)
Satoshi Yamada, Shimadzu Co. (Japan)


Published in SPIE Proceedings Vol. 3977:
Medical Imaging 2000: Physics of Medical Imaging
James T. Dobbins III; John M. Boone, Editor(s)

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