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Proceedings Paper

Recursive correction algorithm for detector decay characteristics in CT
Author(s): Jiang Hsieh; O. E. Gurmen; Kevin F. King
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Paper Abstract

Many studies have been conducted on the utilization of solid state detectors for computed tomography (CT). One of the important performance parameters for the solid state detector has been shown to be the primary speed and afterglow. In this paper, we present a detailed investigation on the signal decay characteristics of the HiLightTM scintillating detector. We first develop an analytical model to fully characterize the detector impulse response. The model sensitivity to x-ray photon energy, detector aging, and radiation exposure is then established and analyzed. The impact of various decay time constants on CT image quality is subsequently illustrated with computer simulations and phantom experiments. Finally, a recursive correction approach is derived and evaluated.

Paper Details

Date Published: 25 April 2000
PDF: 8 pages
Proc. SPIE 3977, Medical Imaging 2000: Physics of Medical Imaging, (25 April 2000); doi: 10.1117/12.384505
Show Author Affiliations
Jiang Hsieh, GE Medical Systems (United States)
O. E. Gurmen, GE Medical Systems (United States)
Kevin F. King, GE Medical Systems (United States)

Published in SPIE Proceedings Vol. 3977:
Medical Imaging 2000: Physics of Medical Imaging
James T. Dobbins III; John M. Boone, Editor(s)

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