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Proceedings Paper

Optimization of key building blocks for a large-area radiographic and fluoroscopic dynamic digital x-ray detector based on a-Si:H/CsI:Tl flat panel technology
Author(s): Thierry Ducourant; Marc Michel; Gerard Vieux; Tobias Peppler; J. C. Trochet; Reiner F. Schulz; Raoul J. M. Bastiaens; Falko Busse
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Paper Abstract

This paper introduces the key design optimizations which have been carried out recently in Trixell in order to prepare the future family of large area, combined static (Radiography) and dynamic (Fluoroscopy, Cardio...) digital X-ray detectors based on a-Si:H/CsI:Tl flat panel technology. These optimizations have been carried out on a 16' X 12' prototype that has been designed and built in a product-oriented way. We describe the detector technology and give some of its main characteristics, as well as some preliminary measurement results.The heart of the new prototype is a Cesium Iodide scintillating screen, directly evaporated onto a 2 K X 2.5 K pixel, array of amorphous silicon photodiodes and TFTs deposited on a glass substrate. The pixel pitch is 155 micrometer. The detective flat panel is connected to dedicated electronics which provides line addressing, low-noise column readout and multiplexing into a serial electrical signal. This signal is digitized over 14 bits to provide a direct digital image output, available for the host radiology system via an optical fiber. This type of detector (flat panel + electronics) is built into a light and thin (less than 100 mm) packaging which can be easily integrated in various x-ray equipment such as R&F tables, Angiography systems (incl. Cardiology), and mobile C-arm systems.

Paper Details

Date Published: 25 April 2000
PDF: 12 pages
Proc. SPIE 3977, Medical Imaging 2000: Physics of Medical Imaging, (25 April 2000); doi: 10.1117/12.384491
Show Author Affiliations
Thierry Ducourant, Trixell (France)
Marc Michel, Trixell (France)
Gerard Vieux, Trixell (France)
Tobias Peppler, Trixell (France)
J. C. Trochet, Trixell (France)
Reiner F. Schulz, Siemens AG (Germany)
Raoul J. M. Bastiaens, Philips Research Labs. (Germany)
Falko Busse, Philips Research Labs. (Germany)


Published in SPIE Proceedings Vol. 3977:
Medical Imaging 2000: Physics of Medical Imaging
James T. Dobbins; John M. Boone, Editor(s)

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