Share Email Print
cover

Proceedings Paper

Aging properties of 840-nm ion-implanted VCSELs monitored by analysis of their photoelectric properties
Author(s): Jens Wolfgang Tomm; A. Baerwolff
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Ion-implanted vertical cavity surface emitting lasers are analyzed by photocurrent spectroscopy. The photoelectric quantum efficiency of such a device was found to reveal information on the presence of defect levels within the device. Photocurrent spectra of the samples, that are in part aged, were measured. For aged devices we find up to a tenfold increase of the magnitude of a defect band energetically situated below the laser emission. We show that photocurrent spectroscopy, that so far has been successfully applied for studying aging properties of high-power diode lasers, has also a remarkable potential as analytical tool for vertical cavity surface emitting lasers.

Paper Details

Date Published: 1 May 2000
PDF: 6 pages
Proc. SPIE 3946, Vertical-Cavity Surface-Emitting Lasers IV, (1 May 2000); doi: 10.1117/12.384384
Show Author Affiliations
Jens Wolfgang Tomm, Max-Born-Institut feur Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
A. Baerwolff, Max-Born-Institut feur Nichtlineare Optik und Kurzzeitspektroskopie (Germany)


Published in SPIE Proceedings Vol. 3946:
Vertical-Cavity Surface-Emitting Lasers IV
Kent D. Choquette; Chun Lei, Editor(s)

© SPIE. Terms of Use
Back to Top