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Proceedings Paper

Gaussian beam profile and single transverse mode emission from previously multimode gain-guided VCSEL using novel etch
Author(s): Loic M. A. Plouzennec; Laurence J. Sargent; Richard V. Penty; Ian H. White; Peter J. Heard; Michael R. T. Tan; Scott W. Corzine; Shih-Yuan Wang
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Paper Abstract

A simple model is used to design and optimize masks that when etched onto the aperture of a normally multi-mode gain guided vertical-cavity surface-emitting laser, VCSEL, cause the device to lase in a single transverse mode. After etching, Gaussian beam profiles for the LP01 mode are achieved over the entire operating current range with greater than 16 dB modal suppression. To date single mode emission at 2 mW has been achieved with pinning of the nearfield width. The modelling shows that the etching introduces a spatial filter on the higher order modes. The power in the fundamental mode remains constant before and after etching.

Paper Details

Date Published: 1 May 2000
PDF: 11 pages
Proc. SPIE 3946, Vertical-Cavity Surface-Emitting Lasers IV, (1 May 2000); doi: 10.1117/12.384378
Show Author Affiliations
Loic M. A. Plouzennec, Univ. of Bristol (United Kingdom)
Laurence J. Sargent, Univ. of Bristol (United Kingdom)
Richard V. Penty, Univ. of Bristol (United Kingdom)
Ian H. White, Univ. of Bristol (United Kingdom)
Peter J. Heard, Univ. of Bristol (United Kingdom)
Michael R. T. Tan, Agilent Technologies (United States)
Scott W. Corzine, Agilent Technologies (United States)
Shih-Yuan Wang, Agilent Technologies (United States)

Published in SPIE Proceedings Vol. 3946:
Vertical-Cavity Surface-Emitting Lasers IV
Kent D. Choquette; Chun Lei, Editor(s)

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