Share Email Print
cover

Proceedings Paper

Highly reliable oxide VCSELs manufactured at HP/Agilent Technologies
Author(s): Robert W. Herrick; Sui F. Lim; Hongyu Deng; Qing Deng; Jim J. Dudley; Mark R. Keever; Tchang-Hun Oh; Melissa Y. Li; M. Tashima; Lee A. Hodge; Xiaolong Zhang; John Herniman; Pete Evans; Bing Liang; Chun Lei
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We discuss the reliability of the oxide VCSELs made by Agilent Technologies (formerly part of Hewlett Packard). Measurements of operating temperature in fiber optic modules are given; these temperatures are higher than generally assumed. General challenges with oxide VCSEL reliability are introduced, and different types of failures are discussed. Long-term oxide VCSEL lifetest results are presented, along with observations about the thermal and current acceleration models. Production monitoring strategies are discussed, and the basic degradation phenomenology is briefly shown.

Paper Details

Date Published: 1 May 2000
PDF: 6 pages
Proc. SPIE 3946, Vertical-Cavity Surface-Emitting Lasers IV, (1 May 2000); doi: 10.1117/12.384365
Show Author Affiliations
Robert W. Herrick, Agilent Technologies (United States)
Sui F. Lim, Agilent Technologies (United States)
Hongyu Deng, Agilent Technologies (United States)
Qing Deng, Agilent Technologies (United States)
Jim J. Dudley, Agilent Technologies (United States)
Mark R. Keever, Agilent Technologies (United States)
Tchang-Hun Oh, Agilent Technologies (United States)
Melissa Y. Li, Agilent Technologies (United States)
M. Tashima, Agilent Technologies (United States)
Lee A. Hodge, Agilent Technologies (United States)
Xiaolong Zhang, Agilent Technologies (United States)
John Herniman, Agilent Technologies (United States)
Pete Evans, Agilent Technologies (United States)
Bing Liang, Agilent Technologies (United States)
Chun Lei, Agilent Technologies (United States)


Published in SPIE Proceedings Vol. 3946:
Vertical-Cavity Surface-Emitting Lasers IV
Kent D. Choquette; Chun Lei, Editor(s)

© SPIE. Terms of Use
Back to Top