Share Email Print
cover

Proceedings Paper

Nanolocalization measurements in spatially modulated illumination microscopy using two coherent illumination beams
Author(s): Bernhard Schneider; Benno Albrecht; P. Jaeckle; Denis Neofotistos; S. Soeding; T. Jaeger; Christoph G. Cremer
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The determination of the 3D nanostructure of specific chromatic regions is highly relevant for an improved understanding of the functional topology of the genome. The use of different spectral signatures for the labeling and high accuracy nanodistance measurements in the spectral precision distance microscopy mode allows the investigation of the topology of such targets in 3D conserved nuclei. To obtain the required high-accuracy nanolocalization of small targets, interferometric illumination is a well established and reliable tool. New approaches use spatially modulated illumination (SMI) in various ways. In our laboratory a stage controlled optical sectioning through the object was applied. In this case the SMI point spread function is the product of the axial illumination modulation and of the conventional PSF of the microscope objective. Using this approach and an appropriate analysis algorithm, the position of 'point-like' fluorescent objects was determined with an axial localization precision in the range of 2nm. To provide a reliable high precision localization performance also for long time measurements, thermally invariant mounting devices have been developed for the SMI-system. Using this improved system, it was possible to measure the thermal shift induced by the microscope objective itself.

Paper Details

Date Published: 27 April 2000
PDF: 10 pages
Proc. SPIE 3921, Optical Diagnostics of Living Cells III, (27 April 2000); doi: 10.1117/12.384227
Show Author Affiliations
Bernhard Schneider, Univ. of Heidelberg (Germany)
Benno Albrecht, Univ. of Heidelberg (Germany)
P. Jaeckle, Univ. of Heidelberg (Germany)
Denis Neofotistos, Univ. of Heidelberg (Germany)
S. Soeding, Univ. of Heidelberg (Germany)
T. Jaeger, Univ. of Heidelberg (Germany)
Christoph G. Cremer, Univ. of Heidelberg (Germany)


Published in SPIE Proceedings Vol. 3921:
Optical Diagnostics of Living Cells III
Daniel L. Farkas; Daniel L. Farkas; Robert C. Leif, Editor(s)

© SPIE. Terms of Use
Back to Top