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Proceedings Paper

Model wavefront sensor for adaptive confocal microscopy
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Paper Abstract

A confocal microscope permits 3D imaging of volume objects by the inclusion of a pinhole in the detector path which eliminates out of focus light. This configuration is however very sensitive to aberrations induced by the specimen or the optical system and would therefore benefit from an adaptive optics approach. We present a wavefront sensor capable of measuring directly the Zernike components of an aberrated wavefront and show that it is particularly applicable to the confocal microscope since only those wavefronts originating in the focal region contribute to the measured aberration.

Paper Details

Date Published: 2 May 2000
PDF: 10 pages
Proc. SPIE 3919, Three-Dimensional and Multidimensional Microscopy: Image Acquisition Processing VII, (2 May 2000); doi: 10.1117/12.384178
Show Author Affiliations
Martin J. Booth, Univ. of Oxford (United Kingdom)
Mark A. A. Neil, Univ. of Oxford (United Kingdom)
Tony Wilson, Univ. of Oxford (United Kingdom)


Published in SPIE Proceedings Vol. 3919:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition Processing VII
Jose-Angel Conchello; Carol J. Cogswell; Andrew G. Tescher; Tony Wilson, Editor(s)

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