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Proceedings Paper

Near-infrared surface-enhanced Raman spectroscopy of biomedically relevant single molecules on colloidal silver and gold clusters
Author(s): Katrin D. Kneipp; Harald Kneipp; Irving Itzkan; Ramachandra R. Dasari; Michael S. Feld
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Paper Abstract

Surface-enhanced Raman scattering (SERS) is a phenomenon resulting in strongly increased Raman signals form molecules which have been attached to nanometer sized metallic structures. The technique combines fingerprint capabilities of vibrational spectroscopy and ultra sensitive detection limits. Silver or gold colloidal clusters can provide total enhancement factors of about 14 orders of magnitude for non- resonant Raman scattering at near IR excitation. Since non- resonant near IR photons are used, photodecomposition of the probed molecule is avoided or, at least strongly reduced, and relatively high excitation intensities can be applied. In addition to the Stokes Raman signal, that linearly depends on excitation laser intensity, at excitation intensities higher than approximately 105-106 W/cm2 and 107 W/cm2, 'pumped' anti-Stokes Raman scattering and surface enhanced hyper Raman scattering, respectively, can be observed. Both effects can provide a non-linear or two-photon Raman probe where the Raman scattering signal depends quadratically on the excitation laser intensity.

Paper Details

Date Published: 21 April 2000
PDF: 7 pages
Proc. SPIE 3922, Scanning and Force Microscopies for Biomedical Applications II, (21 April 2000); doi: 10.1117/12.383359
Show Author Affiliations
Katrin D. Kneipp, Massachusetts Institute of Technology and Technical Univ. of Berlin (Germany)
Harald Kneipp, Massachusetts Institute of Technology (Germany)
Irving Itzkan, Massachusetts Institute of Technology (United States)
Ramachandra R. Dasari, Massachusetts Institute of Technology (United States)
Michael S. Feld, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 3922:
Scanning and Force Microscopies for Biomedical Applications II
Shuming Nie; Eiichi Tamiya; Edward S. Yeung, Editor(s)

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