Share Email Print

Proceedings Paper

Focused ion beam: moving toward nanobiotechnology
Author(s): Marziale Milani; Monica Ballerini; Franco Squadrini
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A new technique of focused ion beam (FIB) microscopy/nanomachining is proposed. Ultrahigh resolution 3D tomography can be performed on whole cell, without preparation. Very fast imaging times allow quasi real time microscopy. FIB is a source of ions which can be precisely oriented and focused on the sample. The resolution can be as low as 15 nm. Higher currents produce 'cutting' and 'attaching' operations of very high precision where at the same time the resulting secondary ions and electrons again provide follow up sample imaging.

Paper Details

Date Published: 21 April 2000
PDF: 10 pages
Proc. SPIE 3922, Scanning and Force Microscopies for Biomedical Applications II, (21 April 2000); doi: 10.1117/12.383351
Show Author Affiliations
Marziale Milani, Univ. degli Studi di Milano-Bicocca and INFM (Italy)
Monica Ballerini, Univ. degli Studi di Milano-Bicocca (Italy)
Franco Squadrini, Univ. degli Studi di Modena (Italy)

Published in SPIE Proceedings Vol. 3922:
Scanning and Force Microscopies for Biomedical Applications II
Shuming Nie; Eiichi Tamiya; Edward S. Yeung, Editor(s)

© SPIE. Terms of Use
Back to Top